Advanced Material Characterization

Topography · Morphology · Composition

We provide advanced characterization combining scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDAX/EDS), and X-ray diffraction (XRD) to study surfaces, particles, textures, and crystalline phases. These techniques support failure analysis, microstructural interpretation, contamination detection, and quantitative phase/texture assessment.

SEM study

SEM is used when magnification requirements exceed those of conventional light microscopy. It visualizes texture and morphology of materials, surfaces, and particles, and is a vital tool in failure analysis. Image interpretation is specialized and performed by experienced experts for reliable conclusions.

EDAX / EDS elemental analysis

EDAX provides elemental composition and quantitative data essential for verifying purity and optimizing processes. It aids phase identification (when combined with other techniques) and supports microstructural studies through elemental mapping to reveal distributions and defects. It is instrumental in detecting contamination and assessing corrosion or wear, enhancing quality control, material selection, and process improvement.

Sample preparation flow

X-ray Diffraction (XRD)

XRD is a promising technique for crystalline materials, enabling phase identification, crystal-structure determination, and texture analysis. It supports powders, thin films, and bulk specimens, and can quantify phases and assess crystallinity.

Talk to an expert

Share specimen details and required outputs (imaging, composition, phases). We’ll confirm preparation, acquisition, and reporting.